TEST reports

Topics:

  • Characterization Testing

  • Temperature (Ovens) Testing

  • Production Wafer Variation Testing

  • Signal-to-Noise Testing

  • Cable Modems

  • Systems-on-a-Chip

  • QAM Radio

  • Digital I/O

  • Analog I/O

  • Chip reports over 1,000 pages

Experience and capabilities:

  • Collating Test Results

  • Test Data Base

  • Multidisciplinary Technical Team Collaboration

  • Data Visualization, Plotting and Charting

  • Remote Testing Over VPNs and LANs

  • Block Diagrams

  • Section Graphics and Navigation Maps

  • Summaries and Conclusions

  • Indexes, Glossaries, Contents, Cross-References

  • Test Equipment Documentation

test and characterization reports: selected pages

NOTE: THE BELOW MATERIAL IS, AS OF 2022, OVER 20 YEARS DATED AND IS NO LONGER GOVERED BY CURRENT NDA.

Block diagrams

 

NOTE: THIS MATERIAL IS, AS OF 2022, OVER 20 YEARS DATED AND IS NO LONGER GOVERED BY CURRENT NDA.